FPGA Design Flow with Automated Test Generation

نویسندگان

  • Karl-Heinz Diener
  • Günter Elst
  • Eero Ivask
  • Jaan Raik
  • Raimund Ubar
چکیده

A novel FPGA design flow combined with automated hierarchical test pattern generation was developed and experimented on a real FPGA circuit for telecommunication. A hierarchical test generator for digital systems described in VHDL is presented. Both, register-transfer (RT) and gate level descriptions are used. Decision diagrams are exploited as a uniform model for describing systems at both levels. The method combines bottom-up and top-down approaches to make hierarchical test generation more efficient. It combines RT level deterministic test planning with gatelevel local test generation based on deterministic approach at the bottom-up working mode or on random approach at the top-town working mode. Experimental results have shown the advantages of using structural tests generated by ATPG compared to using functional test sequences created by designer.

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تاریخ انتشار 1999